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Nanometer material

Vista-IR

NX10 AFM

Nano Indenter® G200

P-7 Stylus Profiler

LiteScope AFM in SEM

Manual Probe Station TS150/TS200/TS300

iNano Nanoindentor

Vista-IR:

AFM SNOM/Nano IR，High precision field strength characterization based on AFM

NX10 AFM:

Comprehensive characterization of sub nano morphology, electrical and mechanical properties

Nano Indenter® G200:

Micro nano indentation, scratch friction and wear test, high temperature nano indentation test

P-7 Stylus Profiler:

Step height test, 2D stress test, 3D mapping

LiteScope AFM in SEM:

In-SEM In situ，Comprehensive characterization of sub nano morphology, electrical and mechanical properties

Manual Probe Station TS150/TS200/TS300:

Probe Station，I-V，C-V，DC，RF，Microwave test

iNano Nanoindentor:

Micro nano indentation, scratch friction and wear test