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      1. Single-Chip AFM
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      5. Photoinduced Force Microscope
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      8. AFM In-SEM
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      1. D series
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      1. Zeta series
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      1. Single Spot Thickness
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      3. Automated Thickness Mapping
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      1. SPR Microscopy
      2. Surface plasmon resonance
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      1. Nano strecher
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      1. In-SEM Manipulation
      2. In-SEM Nanoindentor
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      1. Small R&D platform
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      4. High Power Probe Station
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      1. Needles&Accessories
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      1. In-SEM Atomic Microscopy
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      1. In-SEM Nanoindentor
      2. In-SEM Nano Manipulation
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      1. In-Situ Chips&Holder
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      1. PLD Pulse Laser Deposition
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      1. Passive isolation station
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      1. AFM Probes
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      2. Quantifoil
      3. TEM Accessories
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      1. Grating mold
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SEM Accessories
Brand :mix
Model :Multi
Keywords :Sample holder, Standard sample,Tungsten filament,Conductive adhesive

PinFEI, TESCAN, Zeiss

Diameter:6/6.6/8/9.6/12.7/18/25/ 25.4/32/38/50/100mm

Pin/Pin45°/Pin45°/90° Pin70°Pin90° 


JOEL 

Diameter:9.5/10/12.2/12.5/15/25/32/50mm

JEOL Degree30°/45°/45°/90°/70°/90°

 

Hitachi M4

Diameter:15/25/32/35/50mm



Tungsten filament

Tungsten/LaB6



Sample Maker

Adhesive

Conductive carbon adhesive / conductive silver adhesive / double-sided conductive carbon adhesive / double-sided conductive silver adhesive


Written examination diamond cutting knife
Replaceable refill


Standard Sample

Magnification standard, X-ray standard, SEM resolution standard, backscatter standard, EDS energy spectrum standard and element analysis standard