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LiteScope AFM in SEM
Brand ：NenoVision
Model ：LiteScope
Keywords ：nanoindentor,AFM,In-situ,CPEM,SEM
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The LiteScope™ provides a wide range of Scanning Probe Microscopy (SPM) imaging modes, which can be easily used via replaceable probes.

Comprehensive sample analysis including:

  • characterization of surface topography
  • mechanical properties
  • electrical properties
  • magnetic properties


The LiteScope™ may also be combined with other SEM accessories:

  • Focused Ion Beam (FIB)
  • Gas Injection System (GIS)

for fabrication of nano/microstructures and surface modifications. In this combination, the LiteScope™ offers easy and fast 3D inspection of manufactured structures.

Imaging modes

The LiteScope™ provides and supports a wide spectrum of SPM measurement methods and probes.The cornerstone and most valuable technical feature of its design is the universal probe holder enabling very easy “Plug & Play” installation of different probes.

  • STM (Scanning Tunneling Microscopy)
  • AFM – Contact Mode
  • AFM – Tapping Mode
  • AFM – Conductive Mode
  • MFM (Magnetic Force Microscopy)
  • KPFM (Kelvin Probe Force Microscopy)
  • EFM (Electrostatic Force Microscopy)
  • FMM (Force Modulation Mode)
  • Local voltage measurement
  • Local current measurement

CPEM

Correlative microscopy is an approach that benefits from the imaging of the same object by two different techniques.


LiteScope™ Data

LiteScope™ is usually used in high vacuum, but may also be adapted for ultra high vacuum conditions on request.

  • Operating temperature: +15 °C to +25 °C
  • Standard operating pressure: 10-5 Pa to 105 Pa
  • Overall dimensions: 129 mm x 90 mm x 45-55 mm
  • Total weight: 650 g
  • Maximal scanned sample area: 22 mm x 11 mm x 8 mm
  • Scanner range: 100 um x 100 um x 100 um
  • Resolution: 0.2 nm

Application

In situ SEM/AFM characterisation of hybrid structures made of graphene-veiled gold nanoparticles for bio sensing

The combination of gold nanoparticles and graphene veiling is a novel approach to fabrication of active substrates suitable for Surface Enhanced Raman Spectroscopy (SERS). Graphene can serve as a pin-hole passivation layer, which prevents plasmonic nanostructures from oxidizing. The level of the contact between Au particles and graphene plays a significant role in the sensitivity of SERS. Therefore, it is important to know the way a graphene membrane veils a single nanoparticle or a cluster of such nanoparticles. The distribution of the nanoparticles under the graphene membrane as well as the surface topography can be easily determined using CPEM – Correlative Probe and Electron Microscopy™. While LiteScope™ SPM (AFM) can image the surface of a graphene layer on top of nanoparticles, SEM can image nanoparticles under the graphene layer. AFM images show that graphene does not completely wrap the nanoparticles, this results in reduced SERS effect.

Decomposition of annealed solid solution W-Cr with HfO2particles

This application is focused on the study of microstructure of sample which shows the decomposition of W-10Cr-1Hf (solid solution W-Cr with HfO2 particles) as a result of annealing at 1000 °C for 10 hours. The pores are formed around the hafnium dioxide particles and grow due to the decomposition, also Cr – rich part (dark lamellae or dots) and W – rich part (bright area between the lamellae) are constituted. Using CPEM, it is possible to quickly and accurately distinguish the topographic and the material contrast in SEM images. It is also possible to easily distinguish the grains of Hf from the pores. It was found out different etching rate of the sample surface by CPEM technique.

AFM image, SE image (BSE detector) and CPEM image of sample.

Study of mesenchymal stem cells on collagen scaffold

Collagen scaffold was prepared by friendly freeze drying method (Ceitec BUT, RG 2.3). Then, the scaffold was seeded with mesenchymal stem cells and was incubated under standard culture conditions for 6 days (Department of Histology and Embryology, Masaryk University). Finally, the scaffold was stained with osmium tetroxide and uranyl acetate for better visualization. It was possible to carry out measurement of prepared cells only due to unique LiteScope™ and its precise AFM tip navigation by SEM without damaging the probe in the pores of scaffold. Using CPEM, it was possible to scan the same cell with both the electron beam and the probe and obtain the images. These images are then used to obtain topographic information about the cell and its interaction with the substrate in the meaning of greater spreading of the cell after the scaffold - better adhesion and a more friendly environment.